Opens and Shorts Semiconductor Test Overview
This opens and shorts test system is designed to check for faults in the protection diode circuitry of semiconductor chips. This system comprises hardware and software components.
The system hardware consists of a source measure unit (SMU) and a high-density switching matrix. Signals from individual pins on the DUT are routed sequentially to the SMU through the switch.
The system software consists of three main parts: switching, source and measure, and test management. The switching software configures the high-density switch matrix for measurements by making appropriate connections. The source and measure software programs the SMU and synchronizes it with the switching software to sequentially test pins on the DUT. All code is incorporated into the test management software, which provides a scalable framework for easily adding supplementary tests.