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NI PCI Boards Bring LVDS Digital Test to the Desktop PC
You now can use the NI PCI-6562 and PCI-6561 400 and 200 Mb/s digital waveform generator/analyzers to interface to low-voltage differential signaling (LVDS) devices with desktop PCs. Using LVDS, you can transfer data at faster rates with less power and across longer distances, which is not possible with single-ended technologies.
Learn more.
NI Vice President Delivers Keynote Address at JSEE Convention
National Instruments Vice President of Product Marketing and Academic Relations Ray Almgren delivered the keynote address to engineering educators from universities and high schools at the 53rd annual Japanese Society for Engineering Education (JSEE) conference Sept. 11 in Hiroshima, Japan.
Read more.
Low-Cost PCI DAQ Boards Deliver 3 MS/s Simultaneous-Sampling Rates
You can now use four new simultaneous-sampling National Instruments S Series data acquisition devices for the PCI bus, raising the performance of PC-based instrumentation with simultaneous-sampling rates up to 3 MS/s. The new boards offer high-density, low-cost options ideal for general-purpose data acquisition and automated test, ultrasonics, ballistics, acoustics, high-energy physics, and radar applications.
Learn more.
NI Releases 10 New Express VIs and Highest-Performance PCI Board
The new National Instruments PCI-4461 is a 24-bit data acquisition and generation module and the highest-performance dynamic signal acquisition board on the PCI bus with a 118 dB dynamic range. Its release also includes the National Instruments LabVIEW Sound and Vibration Toolkit Version 4, with 10 new Express VIs for simplified application development.
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NI Multiplexer and DMM/Switch Express VI Expand PXI Capabilities
The National Instruments PXI-2527 300 V, 32-channel multiplexer, along with the new DMM/Switch Express VI, can ease development for data-logging and high-channel-count functional test applications. The hardware and software combination seamlessly integrates with the NI PXI-407x FlexDMM series.
Learn more.
Development Resources
Tutorial: M Series -- The New Data Acquisition Standard
This interactive tutorial puts you in touch with NI engineers as they explain the new technologies behind M Series data acquisition. Learn how NI delivers M Series with more performance, more I/O, and at lower prices.
Take this tutorial.
Graphically Configure Your Timing and Triggering
With this new, free application from National Instruments, you can graphically configure NI-DAQmx timing and triggering for your system. It uses a pair of front panels that pictorially display all the analog input timing and triggering capabilities of your M or E Series device.
Download this free LabVIEW application.
Automating NI Modular Instruments with LabWindows/CVI
National Instruments LabWindows/CVI 7.1 offers C programmers complete integration with the latest NI modular instruments, including the PXI-5922 24-bit, flexible-resolution digitizer and the PXI-4071 7 1/2-digit FlexDMM. NI LabWindows/CVI also provides integration with other modular instruments, including digitizers, function generators, digital multimeters (DMMs), high-speed digital devices, switches, and sound and vibration measurement devices.
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Do More with LabVIEW -- Learn How Add-Ons Can Help
You can now browse the LabVIEW add-ons page by your industry and/or application. To learn how LabVIEW add-ons can enhance your systems, visit ni.com/toolkits today.
Learn more.
Advanced FPGA Programming -- Optimizing for Speed and Size
This presentation, given at NIWeek 2005 by a LabVIEW FPGA Module product support engineer, helps you benchmark your FPGA application, understand how LabVIEW is transformed for an FPGA, and optimize your FPGA VI for speed and size.
View this presentation.
Events
Web Event: Tips and Techniques to Safely Measure High Voltage
Want to improve the safety and accuracy of your high-voltage measurements? This Web event shows how to increase the accuracy and improve the safety of your high-voltage measurements with NI signal conditioning hardware and the LabVIEW graphical development environment.
View this Web event.
Web Event: Real-Time Vision Inspection Systems
Discover how programmable automation controllers (PACs), like NI Compact FieldPoint running powerful LabVIEW Real-Time software, deliver the ability to perform embedded industrial control, networked I/O, and embedded data logging. Also learn how to quickly add full-featured vision inspection to your existing automation line using LabVIEW Real-Time and the new Compact Vision System.
View this Web event.
Web Event: USB Behind-the-Scenes
You probably use USB every day to connect keyboards, mice, and other computer peripherals. Now, learn how USB works and how you can make use of this versatile bus in your measurement, automation, and control systems.
View this Web event.
Web Event: Precision Analog Measurements 101
Explore the fundamentals required to achieve remarkable throughput rates while maintaining precision and stable measurement accuracy up to 23 bits. This introduction discusses how to attain this performance while reducing test system size and cost.
View this Web event.
Web Event: Develop Bluetooth Applications with LabVIEW
Learn how you can wirelessly communicate with PDAs, desktop computers, measurement instruments, and other Bluetooth-enabled devices using the new Bluetooth Compatibility VIs in LabVIEW. See how to configure your system for Bluetooth compatibility and how to establish communication with other devices.
View this Web event.
Support
View Modular Instruments Product Demos
Visit NI Developer Zone to see quick overviews of the main features and capabilities of NI modular instruments.
View demos.
Learn about GUI Applications by Playing Tetris in LabVIEW
Do you want to know how to write GUI applications using a task queue, event structures, and a state machine? A LabVIEW user wrote a Tetris game to help illustrate this task, and you can download it from the discussion forum thread.
Go to the discussion boards.
Digital Test -- Beyond 1s and 0s
Digital signals today are more than just 1s and 0s. Representing digital test patterns with just two states -- drive logic high and drive logic low -- makes critical tests such as response comparison and bidirectional communication unnecessarily complicated and difficult to implement. These tests require the digital tester to generate and acquire data, compare the response data from the device under test with expected data, and return comparison results -- all within the short clock periods of high-speed electronics.
Learn more.
Example Code: Append Data to a Waveform Graph
Unlike a chart, which automatically appends new data to existing data and displays it, a graph only displays data that you send. If you update the graph with new data, it clears its display of any old data and replaces it with the new data. This example code shows an easier way to update a graph with new data.
Download this code.
Example Code: Calculating the Number of Permutations in a Set of Elements
Download this example VI to get the number of r permutations in a set of n distinct elements. This code implements an algorithm that arrives at the answer by way of successive multiplications. This algorithm and the use of double-precision numbers instead of integers helps you achieve calculations with large numbers that would otherwise not be possible.
Download this code.
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