Learn strategies for reducing the cost of test by viewing the archive presentations of the fifth-annual Automated Test Summit. Leading test and measurement companies worldwide participated in this industry event, hosted by National Instruments.

Keynote: Five Trends in Automated Test
Mike Santori, Business and Technology Fellow, National Instruments
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Keynote: Addressing the Challenge of Multicore Programming
Jim St. Leger, Technical Marketing Manager, Intel
John Pasquarette, Director of Software Marketing, National Instruments
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Keynote: Ideal Test Systems for the Automotive Industry
Matthias Krause, President, CGS Automotive, Inc
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Reducing Software Development Costs

Software development offers some of the greatest cost-cutting potential in the automated test system development process. You can reduce software development costs by implementing scalable software architecture. In addition, other tools such as requirements management and benchtop measurement automation can help increase your productivity and reduce costs in the product design phase. Learn how you can reduce the cost of test by exploring the following topics:

• Implementing Parallel Test Architectures - Craig Anderson, National Instruments
• The Challenge of Requirements Management - Eric Larronde-Larretche, Geensys
• Fundamentals of a Solid Software Design - Patrick Kelly, Cal-Bay Systems, Inc.
• Improving Benchtop Measurement Productivity through Automation - Christopher J. Loberg, Tektronix

Optimizing Automated Test Systems

A common challenge with managing automated test equipment is balancing a system's cost/performance ratio in addition to ensuring system longevity and flexibility to add new technologies. With a well-defined modular architecture, hybrid systems help you integrate newer technologies with older hardware and software to maximize your existing investments. In addition to hybrid test system design best practices, learn ways to achieve more efficient instrument usage and power consumption as well as techniques for creating custom instrumentation.

• Why Choose a Modular Test Platform - Travis White, National Instruments
• Designing Hybrid Systems with Multiple Instrument Control Buses - Murali Ravindran, National Instruments
• Designing Custom Instrumentation - John Hottenroth, National Instruments

Extending the Life of Your Automated Test System

Downtime caused by test systems often results in lost company revenue, especially in areas such as manufacturing. Because all electronic and automation devices have a finite lifetime, it is important to understand the availability (uptime) requirements of your applications. Learn best practices for maximizing your system uptime including techniques for effective obsolescence management and system calibration.

• Building High-Availability PXI Systems - Jennifer Schwartz, National Instruments
• Mitigating Obsolescence with Hardware Abstraction Layers (HAL) - Nathan Tacha, National Instruments
• Guarantee Long-Term Accuracy with Calibration - Chad Pelletier, National Instruments
• Updating Deployed Test Systems - Andy Long, Cyth Systems

The Test Engineering Panel

Test engineers face some common challenges. Learn how National Instruments and its partners have overcome these challenges with product life-cycle management, effective global test systems maintenance, standardization techniques, and more.

• Inserting Test Engineering in the Design Cycle - Andrew Mierau, National Instruments
• Enhancing Your Test Engineering Team - Dean Streck, V I Engineering
• Optimizing Test System Management: A Global Approach - Jean-Levy Beaudoin, Averna
• Developing a Test Strategy Based on Product Mix and Volume - Marcus Gavin, National Instruments